Please note: This section is intended to give information on my scientific background. If you wish to learn more about my computer experience, please see my resume.

Erica Schulman

Curriculum Vitae

Education

• Ph. D. in Physics, Columbia University, October 1994.
• A. B. cum laude in Physics, Harvard University, June 1989.

Professional History

• February 1996-present: System Engineer for Lockheed Martin

• August 1994-February 1996: Postdoctoral Fellow for Professor Paul S. Weiss, Department of Chemistry, Pennsylvania State University, University Park, Pennsylvania.

  Used an ultrahigh vacuum, helium-temperature scanning tunneling microscope (STM) to study the interaction of individual adsorbate molecules with clean metal surfaces.

• January 1990-June 1994: Graduate Research Assistant for Professor Robert C. White, Department of Electrical Engineering, Columbia University, New York, New York.

  Dissertation: A scanning tunneling microscopy study of pyromellitic dianhydride-oxydianiline.

  Successfully set up a non-commercial STM for use in an ultrahigh vacuum environment. Determined the necessary parameters to acquire the first STM images and molecular scale spectroscopy of a virgin, multilayer PMDA-ODA surface. Developed new method for for determining activation energies and relaxation times of individual electron trapping sites.

  Co-authored a software package to control the STM, translate output into topographic images and spatially correlated spectroscopy, and perform image editing and analysis. Assembly-level routines required.

• July 1992: Consultant for Dr. Sau Lan Tang, Dupont Experimental Station, Wilmington, Delaware.

  Experimentally tested new lithographic theory to determine feasibilitiy for commercial use. Resulted in the filing of a patent by Dupont.

• June-August 1988: Research Assistant for Professors Michael Tinkham and Christoper J. Lobb, Department of Physics, Harvard University, Cambridge, Massachusetts.

  Implemented new technique of electron beam lithography (canyon lithography) which reduced the narrowest achievable linewidth from 210nm to 30nm. Required techniques included film spin-casting, scanning electron microscopy (SEM), clean room usage, and various etch methods.

Publications

1. Erica N. Schulman and R. C. White, "Determining activation energies and relaxation times of individual electron traps by scanning tunneling microscopy," Physical Review B 52, 7864 (1995).
2. Erica N. Schulman and R. C. White, "Observation of nanometer ordering in multilayer films of pyromellitic dianhydride-oxydianiline using the scanning tunneling microscope and ultrahigh vacuum," Journal of Vacuum Science and Technology A 11, 2348 (1993).
3. Erica N. Schulman and P. S. Weiss, "The effects of a sticky step edge on heterogeneous catalysis," to be published.

Presentations

1. "Activation energies and relaxation times of individual electron traps determined by scanning tunneling microscopy," (invited), University of Cincinnati, November 4, 1994.
2. "Giant conductance fluctuations in ultrasmall-area tunnel junctinos of a poor organic conductor," (invited), Pennsylvania State University, December 14, 1993.
3. Ibid, (invited), University of Texas, Austin, January 7, 1994.
4. "Current noise and spectroscopic aberrations of a poor organic conductor explored by scanning tunneling microscopy" (poster), American Vacuum Society Meeting, November 15-19, 1993.
5. "Observation of nanometer ordering in multilayer films of PMDA-ODA using the scanning tunneling microscope and ultrahigh vacuum" (poster), American Vacuum Society Meeting, November 9-13, 1992.
6. "Spectroscopic study of thin conductive films of pyromellitic dianhydride-oxydianiline," 1992 March Meeting of the American Physical Society, March 16-20, 1992.

Professional Affiliations

• American Physical Society, member.
• American Association for the Advancement of Science, member.

Awards and Honors

• Patricia B. Harris Fellowship, 1989.

Skills

• Extensive programming in C and Mathematica, with routines for statistical analysis, data acquisition, image processing, and lab automation. Familiar with PC and UNIX machines.
• Highly advanced training in physics and mathematics.
• Experience with scanning tunneling microscopy and scanning electron microscopy.
• Practical knowledge of nanoampere measurements, ultrahigh vacuum techniques, lithography, cryogenics, and methods of thin film sample preparation.

ens@ix.netcom.com

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